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Physical Failure Analysis (PFA) offers the leading edge technology and expertise by using advanced analytical tools for structure analysis, materials characterization and failure analysis in the semiconductor and nanotechnology industries.

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SEM

TEM/STEM

FIB/SEM

Full Wafer FIB

SIMS

SRP

SPM/AFM

XRD

X-Ray Imaging

We are a world-class lab in structure analysis,

materials characterization, and failure analysis

Sample preparation: